SOLUTIONS · MACHINE INSPECTION

Machine Inspection

Visual defect detection and quality assurance workflows currently require expensive GPU inference infrastructure to process every frame at line speed. The economics are unforgiving: inspection throughput is bounded by inference throughput, and inference throughput is bought in GPUs.

ERN-AI changes the unit of work. Instead of running a model over every frame, the ALB array operates on extracted events, so inference cost tracks the rate of meaningful change rather than the frame rate of the camera.

Practical Consequences

◆Inspection stations can run at higher line speeds on the same hardware.
◆GPU capital expenditure and power draw fall for a given inspection volume.
◆Low-light inspection becomes viable without IR illumination, verified below 5 lux.
◆Additional stations can be added without a proportional inference budget increase.

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